X-ray structure analysis on the particle
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P Liu; Z.M Gao; Y.M Wang; J Lei
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Article
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1998
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Elsevier Science
⚖ 112 KB
## Ž . Ž . The XRD X-ray Diffraction analysis method and TEM Transmission Electron Microscopy measurement were employed to obtain the size distribution of ultra-fine powder Ni produced by an arc method as described in this paper. Furthermore, the diffraction profile and strain distribution of the