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The X-ray quantum efficiency measurement of high resistivity CCDs

โœ Scribed by Murray, Neil J.; Holland, Andrew D.; Smith, David R.; Gow, Jason P.; Pool, Peter J.; Burt, David J.


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
357 KB
Volume
604
Category
Article
ISSN
0168-9002

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