✦ LIBER ✦
The worst ill-conditioned silicon wafer slicing machine detected by using grey relational analysis
✍ Scribed by Chin-Tsai Lin; Che-Wei Chang; Chie-Bein Chen
- Publisher
- Springer
- Year
- 2006
- Tongue
- English
- Weight
- 204 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0268-3768
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