S u m m a r y !~ Thls is the second of a series of two papers in which the steady stare velocity and temperature distributions in a liquid film are anMytically investigated. The liquid is assumed to appear on a flat surface due to transpiration through a porous medium or the melting of a solid mater
The velocity and temperature distributions in a liquid film
โ Scribed by Mouradian, E. M. ;Sunderland, J. E.
- Book ID
- 104747836
- Publisher
- Springer
- Year
- 1964
- Tongue
- English
- Weight
- 846 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0003-6994
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โฆ Synopsis
T h e s t e a d y s t a t e velocity d i s t r i b u t i o n in a liquid film is i n v e s t i g a t e d analytically. T h e liquid is a s s u m e d to a p p e a r on a flat surIace due to t r a nspiration t h r o u g h a porous m e d i u m or t h e m e l t i n g of a solid material. T h e liquid is considered to be i n t r o d u c e d into t h e film at t h e solid-liquid interface, in a direction n o r m a l to t h e interface, such t h a t mass is continually being a d d e d to t h e film along t h e longitudinal p a t h of flow. T h e flow, which is a s s u m e d to be laminar, occurs u n d e r t h e influence of gravity. E v a p o r a t i o n a n d gaseous b o u n d a r y layer effects are n o t considered. Physical properties of t h e liquid, such as density a n d viscosity are considered constant. T h e c o n t i n u i t y a n d m o m e n t u m equations are set up in integral form a n d t h e film thickness a n d velocity d i s t r i b u t i o n are d e t e r m i n e d b y four different approaches. These four approaches differ from one a n o t h e r b y t h e simplifying a s s u m p t i o n s made. These a s s u m p t i o n s are m a d e in such a w a y t h a t each successive case takes different effects into account, a n d yields a solution based on a more complete analysis.
๐ SIMILAR VOLUMES
Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The first technique is used for film thickness dete