The use of X-ray photoelectron spectroscopy to assess d orbital participation in compounds of silicon and germanium: Chem. Phys. Letters 17 (1972) 611.

The use of X-ray photoelectron spectrosc

The use of X-ray photoelectron spectroscopy to assess d orbital participation in compounds of silicon and germanium

✍ Winfield B. Perry; William L. Jolly 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 243 KB

Chemical shifts in coru binding energies have been determined for analogous gaseous compounds of carbon, silicon and germanium. These data, in conjunction with the atomic charge potential model and both CNDO/Z and electronegativity parameter charges, indicate that the silicon and germanium atoms in