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The use of the photorefractive effect for comprehensive three-dimensional local measurements of electrical and thermal parameters of silicon structures

✍ Scribed by A. L. Filatov; A. V. Lugovskoĭ


Book ID
111444205
Publisher
Springer
Year
2008
Tongue
English
Weight
207 KB
Volume
42
Category
Article
ISSN
1063-7826

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Corrigendum for the paper: K. Boomsma, D
✍ K. Boomsma; D. Poulikakos 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 678 KB

We became aware, [1], that calculation/presentation errors may exist in our paper mentioned above. We went ahead and repeated the calculations in our original work and also used MATLAB to do the same. As a result, we confirmed that this was indeed the case. This corrigendum contains all needed impor