The use of the non-contacting temperature measuring techniques in the early detection of hidden faults in electronic components: P. Tragner Electrocomp. Sci. Technol. 11, 197 (1984)

• Book ID: 104157359
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 85 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80181-6