The effective attenuation lengths (EALs) of photoelectrons in thin silicon dioxide films on an Si(100) substrate were measured as a function of electron energy using synchrotron radiation as an energy-tunable excitation source. The ratios of EALs to inelastic mean free paths (IMFPs) calculated from
โฆ LIBER โฆ
The use of synchrotron radiation to measure electron attenuation lengths in condensed molecular solids
โ Scribed by Roger Stockbauer; Richard L. Kurtz; Noriaki Usuki; Theodore E. Madey
- Book ID
- 107921269
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 356 KB
- Volume
- 246
- Category
- Article
- ISSN
- 0168-9002
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