The use of spatially-dependent carrier capture rates for deep-level-defect transient studies

✍ Scribed by G.P. Li; K.L. Wang

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 853 KB
• Volume: 26
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(83)90052-7