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The Use of Spatial Analysis Techniques in Defect and Nanostructure Studies

✍ Scribed by M.A. Moram; U.E. Gabbai; T.C. Sadler; M.J. Kappers; R.A. Oliver

Publisher: Springer US
Year: 2010
Tongue: English
Weight: 566 KB
Volume: 39
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-010-1177-5

No coin nor oath required. For personal study only.

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