The use of resistance networks and improved estimates of seal resistance to estimate tonoplast conductivity in whole-vacuole patch clamping

✍ Scribed by Scott T. Meissner

• Book ID: 117383641
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 928 KB
• Volume: 123
• Category: Article
• ISSN: 0168-9452
• DOI: 10.1016/s0168-9452(97)04577-9