The Use of Photoinjection to Determine Oxide Charge Distributions and Interface Properties in MOS Structures-Invited Paper

✍ Scribed by Powell, R. J.

Book ID: 117928516
Publisher: IEEE
Year: 1970
Tongue: English
Weight: 954 KB
Volume: 17
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1970.4325765

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