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The Use of Low Temperature Scanning Microscope for Estimating In-Plane Thermal Diffusivity in YBCO Thin Film

✍ Scribed by Matsekh, A.; Kiss, T.; Inoue, M.; Yoshizumi, M.; Sutoh, Y.; Izumi, T.; Shiohara, Y.

Book ID: 125851532
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 759 KB
Volume: 19
Category: Article
ISSN: 1051-8223
DOI: 10.1109/TASC.2009.2017712

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