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The Use of Electron Backscatter Diffraction for the Investigation of Nano Crystalline Materials and the Move Towards Orientation Imaging in the TEM

✍ Scribed by Dingley, David J. ;Nowell, Matthew M.

Book ID: 106196366
Publisher: Springer-Verlag
Year: 2004
Weight: 909 KB
Volume: 147
Category: Article
ISSN: 0344-838X
DOI: 10.1007/s00604-004-0186-6

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