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The use of diffuse reflectance infrared Fourier transform spectroscopy to monitor reactions in low-temperature films and matrices

✍ Scribed by Ian R. Dunkin; Sean L. Gallivan

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 456 KB
Volume: 9
Category: Article
ISSN: 0924-2031
DOI: 10.1016/0924-2031(94)00047-k

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