✦ LIBER ✦
The use of current gain as an indicator for the formation of hot spots due to current crowding in power transistors : F. F. Oettinger and S. Rubin. 10th IEEE Annual Proceedings, Reliability Physics 1972, p. 12
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 110 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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