✦ LIBER ✦
The use of backscatter electron imaging in inspection and evaluation of thick film circuitry : James A. Hain, Gary W. Johnson and John A. Buono. Electron. Prackaging Prodn, 67 (February 1982)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 245 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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