The use of aluminium γ-ray yield ratio for sample uniformity and surface contamination check in PIXE analysis

✍ Scribed by J. Räisänen; R. Hänninen

• Book ID: 113276721
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 385 KB
• Volume: 4
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(84)90588-3