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The use of a diamond heat sink for a high reliability impatt diode : Y. Fukukawa, M. Shinoda, Y. Toyama, M. Yamamoto, S. Yoshioka and K. Kazetani. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 64


Book ID
103269273
Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
114 KB
Volume
12
Category
Article
ISSN
0026-2714

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