The Universal Behaviour of Shallow–Deep Level Instabilities in Semiconductors

✍ Scribed by C. Skierbiszewski; Z. Wilamowski; W. Jantsch

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 153 KB
• Volume: 210
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199812)210:2<765::aid-pssb765>3.0.co;2-5