The transition from the d- to s-state due to thermal fluctuation for high-Tc superconductors as an evidence from the microwave penetration-depth measurement

✍ Scribed by Li Jui Chen; Juh Tzeng Lue

• Book ID: 114553283
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 222 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.709466