The time dependence of the flatband voltage shift of MOS capacitors caused by the injection of minority carriers from Si into SiO2

✍ Scribed by Joseph, B.

• Book ID: 105373572
• Publisher: John Wiley and Sons
• Year: 1979
• Tongue: English
• Weight: 151 KB
• Volume: 51
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210510139