The temperature stability of punch-through diodes : D. De Cogan and Th. G. Van De Roer. Solid-St. Electron. 21, 897 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 121 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90245-7