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The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons

✍ Scribed by Pellish, Jonathan A.; Marshall, Paul W.; LaBel, Kenneth A.; Seifert, Norbert; Gill, Balkaran

Book ID: 115527122
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 992 KB
Volume: 58
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2011.2171004

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