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The surface boron concentration of NixFe80−xB20 samples

✍ Scribed by K. Kristiakova; J. Kristiak; J. Kvitek; J. Cervena

Book ID
103579790
Publisher
Elsevier Science
Year
1982
Weight
49 KB
Volume
199
Category
Article
ISSN
0167-5087

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## Abstract As‐grown (100) homoepitaxial diamond films with boron concentrations [B] from 4.6 × 10^16^ to 1.5 × 10^21^ cm^–3^ have been analysed using X‐ray photoelectron spectroscopy (XPS). Their C 1s core levels contain a dominant component around 284.17 ± 0.2 eV ascribed to sp^3^ C and a main se