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The sub-micron resolution X-ray spectroscopy beamline at NSLS-II

โœ Scribed by V. De Andrade; J. Thieme; P. Northrup; Y. Yao; A. Lanzirotti; P. Eng; Q. Shen


Book ID
113821783
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
784 KB
Volume
649
Category
Article
ISSN
0168-9002

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