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The Study on Fatigue Lifetime Evaluation on the Interconnect of Diaphragm Type Pressure Sensor According to Various

โœ Scribed by Huh, Sun-Chul; Shim, Jae-Joon; Choi, Jin-Ho; Kweon, Jin-Hwe


Book ID
111989443
Publisher
American Scientific Publishers
Year
2008
Tongue
English
Weight
181 KB
Volume
5
Category
Article
ISSN
1546-1955

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