The Study on Fatigue Lifetime Evaluation on the Interconnect of Diaphragm Type Pressure Sensor According to Various

✍ Scribed by Huh, Sun-Chul; Shim, Jae-Joon; Choi, Jin-Ho; Kweon, Jin-Hwe

• Book ID: 111989443
• Publisher: American Scientific Publishers
• Year: 2008
• Tongue: English
• Weight: 181 KB
• Volume: 5
• Category: Article
• ISSN: 1546-1955
• DOI: 10.1166/jctn.2008.870