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The study of transport properties in rough ferromagnetic semiconductor rough junctions

✍ Scribed by Ebrahiminejad, Zh.; Dariani, R.S.; Masoudi, S.F.


Book ID
120318137
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
331 KB
Volume
48
Category
Article
ISSN
1386-9477

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