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The spatial variation of the charged gold concentration in silicon p-n step junctions

โœ Scribed by Schroder, D.K.; Tasch, A.F., Jr.; Chih-Tang Sah


Book ID
114589405
Publisher
IEEE
Year
1968
Tongue
English
Weight
636 KB
Volume
15
Category
Article
ISSN
0018-9383

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The recovery of the charge collection efficiency (CCE) at low temperatures, the so-called ''Lazarus effect'', was studied in Si detectors irradiated by fast reactor neutrons, by protons of medium and high energy, by pions and by gamma-rays. The experimental results show that the Lazarus effect is ob