✦ LIBER ✦
The silane depletion fraction as an indicator for the amorphous/crystalline silicon interface passivation quality
✍ Scribed by Descoeudres, A.; Barraud, L.; Bartlome, R.; Choong, G.; De Wolf, Stefaan; Zicarelli, F.; Ballif, C.
- Book ID
- 121797065
- Publisher
- American Institute of Physics
- Year
- 2010
- Tongue
- English
- Weight
- 355 KB
- Volume
- 97
- Category
- Article
- ISSN
- 0003-6951
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