A high-voltage scanning transmission electron microscope (STEM) H-1250ST of the maximum accelerating voltage of 1.25 MV was constructed at Nagoya University in 1983. The microscope, equipped with a field-emission gun, is designed with high-level STEM performance as well as conventional transmission
β¦ LIBER β¦
The scanning transmission microscope at the NSLS
β Scribed by Harvey Rarback; Chris Buckley; Kaarin Goncz; Harald Ade; Erik Anderson; David Attwood; Phil Batson; Sid Hellman; Chris Jacobsen; Dieter Kern; Janos Kirz; Steve Lindaas; Ian McNulty; Menno Oversluizen; Mark Rivers; Stephen Rothman; Deming Shu; Eshang Tang
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 781 KB
- Volume
- 291
- Category
- Article
- ISSN
- 0168-9002
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## Abstract Zβcontrast imaging and electron energy loss spectroscopy in the scanning transmission electron microscope provide the ability to investigate the structureβcompositionβproperty relationship at individual defects on the atomic scale. In this article, the main principles behind the techniq
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