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The scanning transmission microscope at the NSLS

✍ Scribed by Harvey Rarback; Chris Buckley; Kaarin Goncz; Harald Ade; Erik Anderson; David Attwood; Phil Batson; Sid Hellman; Chris Jacobsen; Dieter Kern; Janos Kirz; Steve Lindaas; Ian McNulty; Menno Oversluizen; Mark Rivers; Stephen Rothman; Deming Shu; Eshang Tang


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
781 KB
Volume
291
Category
Article
ISSN
0168-9002

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πŸ“œ SIMILAR VOLUMES


A high-voltage scanning transmission ele
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A high-voltage scanning transmission electron microscope (STEM) H-1250ST of the maximum accelerating voltage of 1.25 MV was constructed at Nagoya University in 1983. The microscope, equipped with a field-emission gun, is designed with high-level STEM performance as well as conventional transmission

Atomic scale defect analysis in the scan
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## Abstract Z‐contrast imaging and electron energy loss spectroscopy in the scanning transmission electron microscope provide the ability to investigate the structure–composition–property relationship at individual defects on the atomic scale. In this article, the main principles behind the techniq