The role of σ5 coincidence boundaries in the growth selection of Fe—3% Si

✍ Scribed by P. Gangli; J.A. Szpunar

• Book ID: 103957810
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 824 KB
• Volume: 47
• Category: Article
• ISSN: 0924-0136
• DOI: 10.1016/0924-0136(94)90093-0

✦ Synopsis

Texture data, obtained by X-ray diffraction, is used to determine the CSL (E) statistics relating grain orientations in primary recrystallized and secondary recrystallized conventional gain oriented (CGO) 3% silicon steel. The CSL (E) statistics indicate that 575, E13a, and 5717a coincidence boundaries appear in significant quantities. Using the information gathered from the CSL (57) statistics, the 575 operator is chosen to perform orientation transformations calculating primary and secondary recrystallization textures, good agreement being found between the experimental and the calculated textures. It appears that the amount of available E5 coincidence boundaries, relating the grains in the primary recrystallized and those in the secondary recrystallized material, influences the sharpness of the final Goss texture. It is found also that using the 575 operator the main features of the 'desirable primary recrystallization texture' that give a sharp Goss texture can be determined.