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The role of structural stability in the reliability of microwave vacuum devices

✍ Scribed by Hsien-Yang Yeh

Book ID: 114595907
Publisher: IEEE
Year: 1987
Tongue: English
Weight: 589 KB
Volume: 34
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1987.22952

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