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The role of adhesion in tapping-mode atomic force microscopy

✍ Scribed by Sarid, D.; Hunt, J.P.; Workman, R.K.; Yao, X.; Peterson, C.A.

Book ID: 113035265
Publisher: Springer
Year: 1998
Tongue: English
Weight: 113 KB
Volume: 66
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390051146

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