✦ LIBER ✦
The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current
✍ Scribed by W.S. Lau; Peizhen Yang; S.Y. Siah; L. Chan
- Book ID
- 119326723
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 620 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.