✦ LIBER ✦
The reliability of two-terminal parallel-series networks subject to two kinds of failure : M. J. Phillips. Microelectron. Reliab.15, 535 (1976)
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 121 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2714
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