𝔖 Bobbio Scriptorium
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The reliability of P50 suppression as measured by the conditioning/testing ratio is vastly improved by dipole modeling

✍ Scribed by Valerie A. Cardenas; Jack Gerson; George Fein


Book ID
118856481
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
833 KB
Volume
33
Category
Article
ISSN
0006-3223

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