✦ LIBER ✦
The reliability of microelectronic circuit packages as compared to that of conventional circuit packages : J. P. Morone, Jr., Proc. 3rd Ann. New York Conf. Electron. Reliab., pp. 6-2–6-8, sponsored by I.R.E.
- Book ID
- 113189862
- Publisher
- Elsevier Science
- Year
- 1964
- Tongue
- English
- Weight
- 123 KB
- Volume
- 3
- Category
- Article
- ISSN
- 0026-2714
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