✦ LIBER ✦
The reliability of encapsulated and unencapsulated thick-film hybrid microcircuits : R. R. Sutherland. Microelectron. J.17 (4), 35 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 124 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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