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The Relationship of the Degree of Exposure to a Technological Disaster and Emotional Response: A Structural Model Approach

✍ Scribed by Adolfo Jarne Esparcia; Joan Guárdia Olmos


Book ID
110290613
Publisher
Springer Netherlands
Year
2001
Tongue
English
Weight
57 KB
Volume
35
Category
Article
ISSN
0033-5177

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