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The relationship between end-state comfort effects and memory performance in serial and free recall

โœ Scribed by S. Wood Logan; Mark G. Fischman


Book ID
113416927
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
601 KB
Volume
137
Category
Article
ISSN
0001-6918

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## Abstract ## Objective A Dutch translation of the Positive and Negative Affect Scale (PANAS) was used to measure Positive Affect (PA) and its relationship to episodic memory in a sample of Dutch adults between the ages of 40 to 82 years. Specifically, the role of PA was examined as a predictor o