✦ LIBER ✦
The relationship between electromigration-induced short-circuit and open-circuit failure times in multi-layer VLSI technologies : J. R. Lloyd and J. A. Knight. Proc. IEEE Reliab. Phys. Conf. 48 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 263 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
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