The relation between R&D intensity and future market returns: does expensing versus capitalization matter?

✍ Scribed by Howard W. H. Chan; Robert W. Faff; Philip Gharghori; Yew Kee Ho

• Book ID: 106516220
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 310 KB
• Volume: 29
• Category: Article
• ISSN: 0924-865X
• DOI: 10.1007/s11156-007-0023-1