✦ LIBER ✦
The quality of die-attachment and its relationship to stresses and vertical die-cracking : C. G. M. van Kessel, Stephen A. Gee and James J. Murphy. IEEE Trans. Components Hybrids Mfg Technol.CHMT-6 (4), 414 (December 1983)
- Book ID
- 103281200
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 122 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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