✦ LIBER ✦
The process dependence on positive bias temperature aging instability of p+(B) polysilicon-gate MOS devices
✍ Scribed by Ushizaka, H.; Sato, Y.
- Book ID
- 114535113
- Publisher
- IEEE
- Year
- 1993
- Tongue
- English
- Weight
- 529 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0018-9383
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