๐”– Bobbio Scriptorium
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The problems of reliability growth and demonstration with military electronics

โœ Scribed by J.E. Green


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
637 KB
Volume
12
Category
Article
ISSN
0026-2714

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๐Ÿ“œ SIMILAR VOLUMES


Sequential tests for hypotheses concerni
โœ B. Harris; A. P. Soms ๐Ÿ“‚ Article ๐Ÿ“… 1977 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 284 KB

## Abstract Sequential tests for the product of Poisson parameters based on the generalized incomplete modified Bessel (g.i.m.B.) distributions are given. Applications to reliability and biometry are indicated.