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The Potential of the Perturbed Angular Correlation Technique in Characterizing Semiconductors

✍ Scribed by Rakesh Dogra; A.P. Byrne; M.C. Ridgway


Book ID
107455379
Publisher
Springer US
Year
2009
Tongue
English
Weight
518 KB
Volume
38
Category
Article
ISSN
0361-5235

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