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The Non-homologous End-Joining (NHEJ) Mathematical Model for the Repair of Double-Strand Breaks: II. Application to Damage Induced by Ultrasoft X Rays and Low-Energy Electrons

✍ Scribed by Taleei, Reza; Girard, Peter M.; Sankaranarayanan, Krishnaswami; Nikjoo, Hooshang


Book ID
120355670
Publisher
Bioone
Year
2013
Tongue
English
Weight
608 KB
Volume
179
Category
Article
ISSN
0033-7587

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