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The Negative Effect of High-Temperature Annealing on Charge-Carrier Lifetimes in Microcrystalline PCBM

✍ Scribed by J. M. Warman; M. P. de Haas; T. D. Anthopoulos; D. M. de Leeuw

Publisher: John Wiley and Sons
Year: 2006
Tongue: English
Weight: 130 KB
Volume: 18
Category: Article
ISSN: 0935-9648
DOI: 10.1002/adma.200600554

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