A simple method for ohmic loss in conduc
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Y. L. Chow; N. N. Feng; D. G. Fang
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Article
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1999
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John Wiley and Sons
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English
β 94 KB
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The high-frequency skin-depth approximation for ohmic loss calculations is not ¨alid if the conductor thickness decreases and approaches the skin depth. This is the situation in many monolithic ( ) microwa¨e integrated circuits MMICs . The two asymptotes of loss, at dc and at high frequency of the a